Face Image Retrieval Based on Probe Sketch Using SIFT Feature Descriptors

This paper presents a feature-based method for matching facial sketch images to face photographs. Earlier approaches calculated descriptors over the whole image and used some transformation and matched them by some classifiers. We present an idea, where descriptors are calculated at selected discrete points (eyes, nose, ears...). This allows us to compare only prominent features. We use SIFT (Scale Invariant Feature Transform) to extract feature descriptors at the annotated points in the sketches and experiment with various methods to retrieve photos. Experimental results demonstrate appreciable matching performances using the presented feature-based methods at a low computational cost.